AT45DB321D-SU

Note：
1. This report will be invalid if reproduced in whole or in part.  
2. This report refers only to the specimen(s) submitted to test, and is invalid if used separately.
3. This report is ONLY valid with the examination seal and signature of this institute.
4. The tested specimen(s) will only be preserved for thirty days from the date issued, if not collected by the
applicant.
5. This report represents the result of test item only. 
6. The tested specimen(s) are randomly generated, unless Select the whole batch. 

 
Inspection Flow
1 Visual Inspection
2 Function Test (Program TEST)
3 De-capsulation


Method & Equipment
1.1 Optical Microscope 
Equipment Spec.:
Top view: Hirox Hi-scope System HDC300: X7~ X300 

1.2 IN CIRCUIT TESTER 
  Equipment Spec.:
O/S Specification(AutoSet)
(1) I/O Pins: Force=0.2mA----15mA,Clamp Voltage=5.0(V)
Open=3.000(V),Short=0.200(V)
   (2) Power Pins: Force=0.200(mA),Clamp Voltag=5.0(V) 
   (3) Capacitance Test，Resistance Test，Inductance Test，Diode Test，Transistor Test

型号：AT45DB321D-SU

品牌：ATMEL

封装：SOP-8

批号：11+

数据列表： AT45DB321D
产品相片： 8-SOIC
标准包装： 95
类别： 集成电路 (IC)
家庭 ：存储器
系列： -
格式 - 存储器： FLASH
存储器类型： DataFLASH
存储容量： 32M（8192 页 x 528 字节）
速度： 66MHz
接口： SPI，RapidS
电源电压： 2.7 V ~ 3.6 V
工作温度： -40°C ~ 85°C
封装/外壳： 8-SOIC（0.209", 5.30mm 宽）
供应商设备封装： 8-SOIC
包装： 管件