2N7002K

Note： 
1. This report will be invalid if reproduced in whole or in part.  
2. This report refers only to the specimen(s) submitted to test, and is invalid if used separately.
3. This report is ONLY valid with the examination seal and signature of this institute.
4. The tested specimen(s) will only be preserved for thirty days from the date issued, if not collected by the
applicant.
5. This report represents the result of test item only. 
6. The tested specimen(s) are randomly generated, unless Select the whole batch.

Inspection Flow
1 Visual Inspection
2 De-capsulation



Method & Equipment
1.1 Optical Microscope 

  Equipment Spec.:
Top view: Hirox Hi-scope System HDC300: X7~ X300 

Test Results 
Inspection sample 

Visual Inspection  

Note: After visual inspection, there is no abnormal found on the chip. 

De- capsulation 

 
Note: After de-capsulation, there is no abnormal found on the chip. 

型号：2N7002K 

品牌：NXP 

封装：SOT-23 

批号：07+ 

数据列表： 2N7002K
产品相片： SOT-23
产品目录绘图： SuperSOT-3, SOT-23
标准包装： 3,000
类别： 分离式半导体产品
家庭： FET - 单路
系列： -
FET 型： MOSFET N 通道，金属氧化物
FET 特点： 逻辑电平门
开态Rds（最大）@ Id, Vgs @ 25° C 2： 欧姆 @ 500mA, 10V
漏极至源极电压(Vdss) ：60V
电流 - 连续漏极(Id) @ 25° C： 115mA
Id 时的 Vgs(th)（最大）： 2.5V @ 250μA
闸电荷(Qg) @ Vgs： -
在 Vds 时的输入电容(Ciss) ： 50pF @ 25V
功率 - 最大： 350mW
安装类型： 表面贴装
封装/外壳： TO-236-3, SC-59, SOT-23-3
供应商设备封装： SOT-23